Degradation study of AIGaN/GaN HEMT through electro-thermo-mechanical calculations and thermo-reflectance measurements

Degradation study of AIGaN/GaN HEMT through electro-thermo-mechanical calculations and thermo-reflectance measurements

Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2010.

Bibliographic Details
Main Author: Gao, Feng, Ph. D. Massachusetts Institute of Technology
Other Authors: Tomás Palacios.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2011
Subjects:
Materials Science and Engineering.
Online Access:http://hdl.handle.net/1721.1/62683

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