Test Generation Guided Design for Testability

This thesis presents a new approach to building a design for testability (DFT) system. The system takes a digital circuit description, finds out the problems in testing it, and suggests circuit modifications to correct those problems. The key contributions of the thesis research are (1) settin...

詳細記述

書誌詳細
第一著者: Wu, Peng
言語:en_US
出版事項: 2004
主題:
オンライン・アクセス:http://hdl.handle.net/1721.1/6837