Test Generation Guided Design for Testability
This thesis presents a new approach to building a design for testability (DFT) system. The system takes a digital circuit description, finds out the problems in testing it, and suggests circuit modifications to correct those problems. The key contributions of the thesis research are (1) settin...
| Main Author: | |
|---|---|
| Language: | en_US |
| Published: |
2004
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/1721.1/6837 |