Finite-geometry models of electric field noise from patch potentials in ion traps

We model electric field noise from fluctuating patch potentials on conducting surfaces by taking into account the finite geometry of the ion trap electrodes to gain insight into the origin of anomalous heating in ion traps. The scaling of anomalous heating rates with surface distance d is obtained f...

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Detalhes bibliográficos
Principais autores: Low, Guang Hao, Herskind, Peter F., Chuang, Isaac L.
Outros Autores: Massachusetts Institute of Technology. Department of Physics
Formato: Artigo
Idioma:en_US
Publicado em: American Physical Society (APS) 2012
Acesso em linha:http://hdl.handle.net/1721.1/69568
https://orcid.org/0000-0001-7296-523X
https://orcid.org/0000-0002-6211-982X