Finite-geometry models of electric field noise from patch potentials in ion traps
We model electric field noise from fluctuating patch potentials on conducting surfaces by taking into account the finite geometry of the ion trap electrodes to gain insight into the origin of anomalous heating in ion traps. The scaling of anomalous heating rates with surface distance d is obtained f...
Main Authors: | Low, Guang Hao, Herskind, Peter F., Chuang, Isaac L. |
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Other Authors: | Massachusetts Institute of Technology. Department of Physics |
Format: | Article |
Language: | en_US |
Published: |
American Physical Society (APS)
2012
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Online Access: | http://hdl.handle.net/1721.1/69568 https://orcid.org/0000-0001-7296-523X https://orcid.org/0000-0002-6211-982X |
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