Finite-geometry models of electric field noise from patch potentials in ion traps

We model electric field noise from fluctuating patch potentials on conducting surfaces by taking into account the finite geometry of the ion trap electrodes to gain insight into the origin of anomalous heating in ion traps. The scaling of anomalous heating rates with surface distance d is obtained f...

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Bibliographic Details
Main Authors: Low, Guang Hao, Herskind, Peter F., Chuang, Isaac L.
Other Authors: Massachusetts Institute of Technology. Department of Physics
Format: Article
Language:en_US
Published: American Physical Society (APS) 2012
Online Access:http://hdl.handle.net/1721.1/69568
https://orcid.org/0000-0001-7296-523X
https://orcid.org/0000-0002-6211-982X

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