Characterization and analysis of process variability in deeply-scaled MOSFETs

समान संसाधन

• Design and characterization of Si/SiGe heterostructure sub-100 nm bulk p-MOSFET
  द्वारा: Lee, Jae-kyu, Ph. D. Massachusetts Institute of Technology
  प्रकाशित: (2010)
• InGaAs Quantum-Well MOSFETs for logic applications
  द्वारा: Lin, Jianqiang, Ph. D. Massachusetts Institute of Technology
  प्रकाशित: (2015)
• Hole transport in strained SiGe-channel MOSFETs : velocity in scaled devices and mobility under applied mechanical strain
  द्वारा: Gomez, Leonardo, Ph. D. Massachusetts Institute of Technology
  प्रकाशित: (2010)
• InGaAs MOSFETs for logic and RF applications : reliability, scalability and transport studies
  द्वारा: Cai, Xiaowei,Ph.D.Massachusetts Institute of Technology.
  प्रकाशित: (2019)
• Analysis of variation in on-chip waveguide distribution schemes and optical receiver circuits
  द्वारा: Balakrishnan, Karthik, Ph. D. Massachusetts Institute of Technology
  प्रकाशित: (2007)