Large-area and high-resolution distortion measurement based on moire fringe method for hot embossing process
A moiré fringe approach is developed to identify simultaneously the global and local distortions in hot-embossed polymeric samples. A square grid pattern with a pitch of 63.5 μm is hot-embossed on the polymer substrate. When a reference grid, a polymeric film with the same pattern, is placed on top...
| Main Authors: | , , , , |
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| Other Authors: | |
| Format: | Article |
| Language: | en_US |
| Published: |
Optical Society of America
2012
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| Online Access: | http://hdl.handle.net/1721.1/71162 https://orcid.org/0000-0002-0417-445X |