Ultrafast Photocurrent Measurement of the Escape Time of Electrons and Holes from Carbon Nanotube p-i-n Photodiodes

Ultrafast Photocurrent Measurement of the Escape Time of Electrons and Holes from Carbon Nanotube p-i-n Photodiodes

Ultrafast photocurrent measurements are performed on individual carbon nanotube p-i-n photodiodes. The photocurrent response to subpicosecond pulses separated by a variable time delay Δt shows strong photocurrent suppression when two pulses overlap (Δt=0). The picosecond-scale decay time of photocur...

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Bibliographic Details
Main Authors: Gabor, Nathaniel M., Zhong, Zhaohui, Bosnick, Ken, McEuen, Paul L.
Other Authors: Massachusetts Institute of Technology. Department of Physics
Format: Article
Language:en_US
Published: American Physical Society 2012
Online Access:http://hdl.handle.net/1721.1/71545

Internet

http://hdl.handle.net/1721.1/71545

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