Laser-induced charging of microfabricated ion traps

Laser-induced charging of microfabricated ion traps

Electrical charging of metal surfaces due to photoelectric generation of carriers is of concern in trapped ion quantum computation systems, due to the high sensitivity of the ions’ motional quantum states to deformation of the trapping potential. The charging induced by typical laser frequencies inv...

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Bibliographic Details
Main Authors: Low, Guang Hao, Lachenmyer, Nathan S., Ge, Yufei, Herskind, Peter F., Chuang, Isaac L., Wang, Shannon X.
Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Format: Article
Language:en_US
Published: American Institute of Physics (AIP) 2012
Online Access:http://hdl.handle.net/1721.1/71950
https://orcid.org/0000-0001-7296-523X
https://orcid.org/0000-0002-6211-982X

Internet

http://hdl.handle.net/1721.1/71950
https://orcid.org/0000-0001-7296-523X
https://orcid.org/0000-0002-6211-982X

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