Enabling System-Level Modeling of Variation-Induced Faults in Networks-on-Chip

Process Variation (PV) is increasingly threatening the reliability of Networks-on-Chips. Thus, various resilient router designs have been recently proposed and evaluated. However, these evaluations assume random fault distributions, which result in 52%--81% inaccuracy. We propose an accurate circuit...

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Bibliographic Details
Main Authors: Aisopos, Konstantinos, Chen, Chia-Hsin, Peh, Li-Shiuan
Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Format: Article
Language:en_US
Published: Association for Computing Machinery (ACM) 2012
Online Access:http://hdl.handle.net/1721.1/72480
https://orcid.org/0000-0001-9010-6519
https://orcid.org/0000-0003-1284-6620