Performance Metrics and Empirical Results of a PUF Cryptographic Key Generation ASIC

Performance Metrics and Empirical Results of a PUF Cryptographic Key Generation ASIC

We describe a PUF design with integrated error correction that is robust to various layout implementations and achieves excellent and consistent results in each of the following four areas: Randomness, Uniqueness, Bias and Stability. 133 PUF devices in 0.13 μm technology encompassing seven circuit l...

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Bibliographic Details
Main Authors: Yu, Meng-Day (Mandel), Sowell, Richard, Singh, Alok, M’Raihi, David, Devadas, Srinivas
Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Format: Article
Language:en_US
Published: Institute of Electrical and Electronics Engineers (IEEE) 2012
Online Access:http://hdl.handle.net/1721.1/73113
https://orcid.org/0000-0001-8253-7714

Internet

http://hdl.handle.net/1721.1/73113
https://orcid.org/0000-0001-8253-7714

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