Transplanting assembly of carbon-nanotube-tipped atomic force microscope probes

Transplanting assembly of carbon-nanotube-tipped atomic force microscope probes

Carbon-nanotube (CNT)-tipped atomic force microscope (AFM) probes were assembled in a deterministic and reproducible manner by transplanting a CNT bearing polymeric carrier to a microelectromechanical systems cantilever. Single-strand CNTs were grown vertically at predefined locations where each CNT...

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Bibliographic Details
Main Authors: Soohyung, Kim, Lee, Hyung Woo, Kim, Sang-Gook
Other Authors: Massachusetts Institute of Technology. Department of Mechanical Engineering
Format: Article
Language:en_US
Published: American Institute of Physics 2012
Online Access:http://hdl.handle.net/1721.1/75217
https://orcid.org/0000-0002-3125-3268

Internet

http://hdl.handle.net/1721.1/75217
https://orcid.org/0000-0002-3125-3268

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