Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency

Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency

Synchrotron-based X-ray fluorescence microscopy is applied to study the evolution of iron silicide precipitates during phosphorus diffusion gettering and low-temperature annealing. Heavily Fe-contaminated ingot border material contains FeSi2 precipitates after rapid in-line P-diffusion firing, sugge...

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Bibliographic Details
Main Authors: Fenning, David P., Hofstetter, Jasmin, Bertoni, Mariana I., Lelievre, J. F., del Canizo, C., Buonassisi, Tonio
Other Authors: Massachusetts Institute of Technology. Department of Mechanical Engineering
Format: Article
Language:en_US
Published: Institute of Electrical and Electronics Engineers 2013
Online Access:http://hdl.handle.net/1721.1/78325
https://orcid.org/0000-0002-4609-9312
https://orcid.org/0000-0001-8345-4937

Internet

http://hdl.handle.net/1721.1/78325
https://orcid.org/0000-0002-4609-9312
https://orcid.org/0000-0001-8345-4937

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