Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency
Synchrotron-based X-ray fluorescence microscopy is applied to study the evolution of iron silicide precipitates during phosphorus diffusion gettering and low-temperature annealing. Heavily Fe-contaminated ingot border material contains FeSi2 precipitates after rapid in-line P-diffusion firing, sugge...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | en_US |
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Institute of Electrical and Electronics Engineers
2013
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| Online Access: | http://hdl.handle.net/1721.1/78325 https://orcid.org/0000-0002-4609-9312 https://orcid.org/0000-0001-8345-4937 |
| _version_ | 1826213836917571584 |
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| author | Fenning, David P. Hofstetter, Jasmin Bertoni, Mariana I. Lelievre, J. F. del Canizo, C. Buonassisi, Tonio |
| author2 | Massachusetts Institute of Technology. Department of Mechanical Engineering |
| author_facet | Massachusetts Institute of Technology. Department of Mechanical Engineering Fenning, David P. Hofstetter, Jasmin Bertoni, Mariana I. Lelievre, J. F. del Canizo, C. Buonassisi, Tonio |
| author_sort | Fenning, David P. |
| collection | MIT |
| description | Synchrotron-based X-ray fluorescence microscopy is applied to study the evolution of iron silicide precipitates during phosphorus diffusion gettering and low-temperature annealing. Heavily Fe-contaminated ingot border material contains FeSi2 precipitates after rapid in-line P-diffusion firing, suggesting kinetically limited gettering in these regions. An impurity-to-efficiency (I2E) gettering model is developed to explain the results. The model demonstrates the efficacy of high- and medium-temperature processing on reducing the interstitial iron population over a range of process parameters available to industry. |
| first_indexed | 2024-09-23T15:55:36Z |
| format | Article |
| id | mit-1721.1/78325 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T15:55:36Z |
| publishDate | 2013 |
| publisher | Institute of Electrical and Electronics Engineers |
| record_format | dspace |
| spelling | mit-1721.1/783252022-10-02T05:05:33Z Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency Fenning, David P. Hofstetter, Jasmin Bertoni, Mariana I. Lelievre, J. F. del Canizo, C. Buonassisi, Tonio Massachusetts Institute of Technology. Department of Mechanical Engineering Massachusetts Institute of Technology. Photovoltaic Research Laboratory Fenning, David P. Bertoni, Mariana I. Buonassisi, Tonio Synchrotron-based X-ray fluorescence microscopy is applied to study the evolution of iron silicide precipitates during phosphorus diffusion gettering and low-temperature annealing. Heavily Fe-contaminated ingot border material contains FeSi2 precipitates after rapid in-line P-diffusion firing, suggesting kinetically limited gettering in these regions. An impurity-to-efficiency (I2E) gettering model is developed to explain the results. The model demonstrates the efficacy of high- and medium-temperature processing on reducing the interstitial iron population over a range of process parameters available to industry. United States. Dept. of Energy (contract number DE-FG36-09GO1900) National Science Foundation (U.S.) (NSF Graduate Research Fellowship) Barcelona Chamber of Commerce (MIT-Spain/La Cambra de Barcelona Seed Fund) 2013-04-10T15:33:26Z 2013-04-10T15:33:26Z 2013-04-10 Article http://purl.org/eprint/type/ConferencePaper 978-1-4244-5892-9 978-1-4244-5890-5 0160-8371 INSPEC Accession Number: 11625647 http://hdl.handle.net/1721.1/78325 Fenning, D. P. et al. “Synchrotron-based Microanalysis of Iron Distribution After Thermal Processing and Predictive Modeling of Resulting Solar Cell Efficiency.” 2010 35th IEEE Photovoltaic Specialists Conference (PVSC), 2010. 000430–000431. CrossRef. Web. © Copyright 2010 IEEE. https://orcid.org/0000-0002-4609-9312 https://orcid.org/0000-0001-8345-4937 en_US http://dx.doi.org/10.1109/PVSC.2010.5616767 Proceedings of the 2010 35th IEEE Photovoltaic Specialists Conference (PVSC) Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf Institute of Electrical and Electronics Engineers IEEE |
| spellingShingle | Fenning, David P. Hofstetter, Jasmin Bertoni, Mariana I. Lelievre, J. F. del Canizo, C. Buonassisi, Tonio Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency |
| title | Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency |
| title_full | Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency |
| title_fullStr | Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency |
| title_full_unstemmed | Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency |
| title_short | Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency |
| title_sort | synchrotron based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency |
| url | http://hdl.handle.net/1721.1/78325 https://orcid.org/0000-0002-4609-9312 https://orcid.org/0000-0001-8345-4937 |
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