Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency
Synchrotron-based X-ray fluorescence microscopy is applied to study the evolution of iron silicide precipitates during phosphorus diffusion gettering and low-temperature annealing. Heavily Fe-contaminated ingot border material contains FeSi2 precipitates after rapid in-line P-diffusion firing, sugge...
| Main Authors: | , , , , , |
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| Other Authors: | |
| Format: | Article |
| Language: | en_US |
| Published: |
Institute of Electrical and Electronics Engineers
2013
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| Online Access: | http://hdl.handle.net/1721.1/78325 https://orcid.org/0000-0002-4609-9312 https://orcid.org/0000-0001-8345-4937 |