Residual stress in electrodeposited nanocrystalline nickel-tungsten coatings
Characterizing the residual stress of thick nanocrystalline electrodeposits poses several unique challenges due to their fine grain structure, thickness distribution, and matte surface. We use a three-dimensional profilometry-based approach that addresses each of these complicating factors and enabl...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Language: | en_US |
| Published: |
Cambridge University Press (Materials Research Society)
2013
|
| Online Access: | http://hdl.handle.net/1721.1/79788 https://orcid.org/0000-0001-9856-2682 |