TID Tolerance of Popular CubeSat Components

TID Tolerance of Popular CubeSat Components

In this paper we report total dose test results of COTS components commonly used on CubeSats. We investigate a variety of analog integrated circuits, a popular microcontroller (PIC24) as well as SD memory cards

Bibliographic Details
Main Authors: Schmidt, Frank Hall, Cahoy, Kerri, Sklair, Devon A., Blackwell, William J., Osarentin, I., Legge Jr, Robert S., Kingsbury, Ryan W
Other Authors: Lincoln Laboratory
Format: Article
Language:en_US
Published: 2013
Online Access:http://hdl.handle.net/1721.1/81179
https://orcid.org/0000-0003-1552-4432
https://orcid.org/0000-0002-7791-5124

Internet

http://hdl.handle.net/1721.1/81179
https://orcid.org/0000-0003-1552-4432
https://orcid.org/0000-0002-7791-5124

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