TID Tolerance of Popular CubeSat Components
In this paper we report total dose test results of COTS components commonly used on CubeSats. We investigate a variety of analog integrated circuits, a popular microcontroller (PIC24) as well as SD memory cards
Main Authors: | Schmidt, Frank Hall, Cahoy, Kerri, Sklair, Devon A., Blackwell, William J., Osarentin, I., Legge Jr, Robert S., Kingsbury, Ryan W |
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Other Authors: | Lincoln Laboratory |
Format: | Article |
Language: | en_US |
Published: |
2013
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Online Access: | http://hdl.handle.net/1721.1/81179 https://orcid.org/0000-0003-1552-4432 https://orcid.org/0000-0002-7791-5124 |
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