Decoupling bulk- and surface-limited lifetimes in thin kerfless silicon wafers using spectrally resolved transient absorption pump-probe spectroscopy and computer simulations
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2013.
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Format: | Thesis |
Language: | eng |
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Massachusetts Institute of Technology
2013
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Online Access: | http://hdl.handle.net/1721.1/82298 |