Modeling of and experiments characterizing electromigration-induced failures in interconnects

Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2001.

Bibliographic Details
Main Author:	Andleigh, Vaibhav K. (Vaibhav Kumar), 1973-
Other Authors:	Carl V. Thompson.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2005
Subjects:	Materials Science and Engineering.
Online Access:	http://hdl.handle.net/1721.1/8429

Internet

http://hdl.handle.net/1721.1/8429