A method for infrared temperature measurements of thin film materials with a low, unknown, and/or variable emissivity at low temperatures

Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2013.

Detaylı Bibliyografya
Yazar: Jarboe, Jason Neal
Diğer Yazarlar: Alexander H. Slocum.
Materyal Türü: Tez
Dil:eng
Baskı/Yayın Bilgisi: Massachusetts Institute of Technology 2014
Konular:
Online Erişim:http://hdl.handle.net/1721.1/84401