A method for infrared temperature measurements of thin film materials with a low, unknown, and/or variable emissivity at low temperatures

Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2013.

Detaylı Bibliyografya
Yazar:	Jarboe, Jason Neal
Diğer Yazarlar:	Alexander H. Slocum.
Materyal Türü:	Tez
Dil:	eng
Baskı/Yayın Bilgisi:	Massachusetts Institute of Technology 2014
Konular:	Mechanical Engineering.
Online Erişim:	http://hdl.handle.net/1721.1/84401

Internet

http://hdl.handle.net/1721.1/84401