A method for infrared temperature measurements of thin film materials with a low, unknown, and/or variable emissivity at low temperatures
Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2013.
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| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2014
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| Online Access: | http://hdl.handle.net/1721.1/84401 |
| Summary: | Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2013. |
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