A method for infrared temperature measurements of thin film materials with a low, unknown, and/or variable emissivity at low temperatures

Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2013.

Bibliographic Details
Main Author: Jarboe, Jason Neal
Other Authors: Alexander H. Slocum.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2014
Subjects:
Online Access:http://hdl.handle.net/1721.1/84401
Description
Summary:Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2013.