A method for infrared temperature measurements of thin film materials with a low, unknown, and/or variable emissivity at low temperatures
Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2013.
| Main Author: | |
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| Other Authors: | |
| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2014
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| Online Access: | http://hdl.handle.net/1721.1/84401 |
| _version_ | 1811087748891672576 |
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| author | Jarboe, Jason Neal |
| author2 | Alexander H. Slocum. |
| author_facet | Alexander H. Slocum. Jarboe, Jason Neal |
| author_sort | Jarboe, Jason Neal |
| collection | MIT |
| description | Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2013. |
| first_indexed | 2024-09-23T13:51:24Z |
| format | Thesis |
| id | mit-1721.1/84401 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T13:51:24Z |
| publishDate | 2014 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/844012019-04-11T07:07:21Z A method for infrared temperature measurements of thin film materials with a low, unknown, and/or variable emissivity at low temperatures Jarboe, Jason Neal Alexander H. Slocum. Massachusetts Institute of Technology. Department of Mechanical Engineering. Massachusetts Institute of Technology. Department of Mechanical Engineering. Mechanical Engineering. Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2013. Cataloged from PDF version of thesis. Includes bibliographical references. Accurate non-contact temperature measurements of objects using thermal radiation is often limited by low emission of IR radiation because of low temperatures and/or emissivities, or by the unknown or changing emissivity of the material being measured. This thesis covers an effort to build a practical, inexpensive, and widely applicable non-contact system for accurately measuring the temperatures of materials of low, unknown, and/or variable emissivity. The method to be used is intended specifically for those objects at low temperatures (below 100 degrees Celsius), which are conventionally the most difficult to accurately measure. by Jason Neal Jarboe. S.B. 2014-01-23T18:41:40Z 2014-01-23T18:41:40Z 2013 Thesis http://hdl.handle.net/1721.1/84401 867866751 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 72 pages application/pdf Massachusetts Institute of Technology |
| spellingShingle | Mechanical Engineering. Jarboe, Jason Neal A method for infrared temperature measurements of thin film materials with a low, unknown, and/or variable emissivity at low temperatures |
| title | A method for infrared temperature measurements of thin film materials with a low, unknown, and/or variable emissivity at low temperatures |
| title_full | A method for infrared temperature measurements of thin film materials with a low, unknown, and/or variable emissivity at low temperatures |
| title_fullStr | A method for infrared temperature measurements of thin film materials with a low, unknown, and/or variable emissivity at low temperatures |
| title_full_unstemmed | A method for infrared temperature measurements of thin film materials with a low, unknown, and/or variable emissivity at low temperatures |
| title_short | A method for infrared temperature measurements of thin film materials with a low, unknown, and/or variable emissivity at low temperatures |
| title_sort | method for infrared temperature measurements of thin film materials with a low unknown and or variable emissivity at low temperatures |
| topic | Mechanical Engineering. |
| url | http://hdl.handle.net/1721.1/84401 |
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