A method for infrared temperature measurements of thin film materials with a low, unknown, and/or variable emissivity at low temperatures

A method for infrared temperature measurements of thin film materials with a low, unknown, and/or variable emissivity at low temperatures

Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2013.

Bibliographic Details
Main Author:	Jarboe, Jason Neal
Other Authors:	Alexander H. Slocum.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2014
Subjects:	Mechanical Engineering.
Online Access:	http://hdl.handle.net/1721.1/84401

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