Critical-current reduction in thin superconducting wires due to current crowding

We demonstrate experimentally that the critical current in superconducting NbTiN wires is dependent on their geometrical shape, due to current-crowding effects. Geometric patterns such as 90˚ corners and sudden expansions of wire width are shown to result in the reduction of critical currents. The r...

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Bibliographic Details
Main Authors: Berggren, Karl K., Hortensius, H. L., Driessen, E. F. C., Klapwijk, T. M., Clem, John R.
Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Format: Article
Language:en_US
Published: American Institute of Physics (AIP) 2014
Online Access:http://hdl.handle.net/1721.1/85960
https://orcid.org/0000-0001-7453-9031