Critical-current reduction in thin superconducting wires due to current crowding
We demonstrate experimentally that the critical current in superconducting NbTiN wires is dependent on their geometrical shape, due to current-crowding effects. Geometric patterns such as 90˚ corners and sudden expansions of wire width are shown to result in the reduction of critical currents. The r...
| Main Authors: | , , , , |
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| Other Authors: | |
| Format: | Article |
| Language: | en_US |
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American Institute of Physics (AIP)
2014
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| Online Access: | http://hdl.handle.net/1721.1/85960 https://orcid.org/0000-0001-7453-9031 |
| _version_ | 1826206293539422208 |
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| author | Berggren, Karl K. Hortensius, H. L. Driessen, E. F. C. Klapwijk, T. M. Clem, John R. |
| author2 | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science |
| author_facet | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Berggren, Karl K. Hortensius, H. L. Driessen, E. F. C. Klapwijk, T. M. Clem, John R. |
| author_sort | Berggren, Karl K. |
| collection | MIT |
| description | We demonstrate experimentally that the critical current in superconducting NbTiN wires is dependent on their geometrical shape, due to current-crowding effects. Geometric patterns such as 90˚ corners and sudden expansions of wire width are shown to result in the reduction of critical currents. The results are relevant for single-photon detectors as well as parametric amplifiers. |
| first_indexed | 2024-09-23T13:27:11Z |
| format | Article |
| id | mit-1721.1/85960 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T13:27:11Z |
| publishDate | 2014 |
| publisher | American Institute of Physics (AIP) |
| record_format | dspace |
| spelling | mit-1721.1/859602022-09-28T14:20:22Z Critical-current reduction in thin superconducting wires due to current crowding Berggren, Karl K. Hortensius, H. L. Driessen, E. F. C. Klapwijk, T. M. Clem, John R. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Massachusetts Institute of Technology. Research Laboratory of Electronics Berggren, Karl K. We demonstrate experimentally that the critical current in superconducting NbTiN wires is dependent on their geometrical shape, due to current-crowding effects. Geometric patterns such as 90˚ corners and sudden expansions of wire width are shown to result in the reduction of critical currents. The results are relevant for single-photon detectors as well as parametric amplifiers. National Science Foundation (U.S.) (ECCS-0823778) United States. Dept. of Energy. Office of Basic Energy Sciences (Division of Materials Science and Engineering) 2014-03-28T17:33:19Z 2014-03-28T17:33:19Z 2012-05 2012-03 Article http://purl.org/eprint/type/JournalArticle 0003-6951 1077-3118 http://hdl.handle.net/1721.1/85960 Hortensius, H. L. et al. “Critical-Current Reduction in Thin Superconducting Wires due to Current Crowding.” Applied Physics Letters 100.18 (2012): 182602. https://orcid.org/0000-0001-7453-9031 en_US http://dx.doi.org/10.1063/1.4711217 Applied Physics Letter application/pdf American Institute of Physics (AIP) |
| spellingShingle | Berggren, Karl K. Hortensius, H. L. Driessen, E. F. C. Klapwijk, T. M. Clem, John R. Critical-current reduction in thin superconducting wires due to current crowding |
| title | Critical-current reduction in thin superconducting wires due to current crowding |
| title_full | Critical-current reduction in thin superconducting wires due to current crowding |
| title_fullStr | Critical-current reduction in thin superconducting wires due to current crowding |
| title_full_unstemmed | Critical-current reduction in thin superconducting wires due to current crowding |
| title_short | Critical-current reduction in thin superconducting wires due to current crowding |
| title_sort | critical current reduction in thin superconducting wires due to current crowding |
| url | http://hdl.handle.net/1721.1/85960 https://orcid.org/0000-0001-7453-9031 |
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