Relating process measurements to customer dissatisfiers

Relating process measurements to customer dissatisfiers

Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science; and, (S.M.)--Massachusetts Institute of Technology, Sloan School of Management, 2000.

Bibliografische gegevens
Hoofdauteur: Schaefer, Mark Stephen, 1972-
Andere auteurs: Roy E. Welsch and Daniel E. Whitney.
Formaat: Thesis
Taal:eng
Gepubliceerd in: Massachusetts Institute of Technology 2014
Onderwerpen:
Electrical Engineering and Computer Science.
Sloan School of Management.
Online toegang:http://hdl.handle.net/1721.1/86550

Internet

http://hdl.handle.net/1721.1/86550

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