Materials properties and dislocation dynamics in InAsP compositionally graded buffers on InP substrates

The properties of InAs [subscript x]P1[subscript −x] compositionally graded buffers grown by metal organic chemical vapor deposition are investigated. We report the effects of strain gradient (ε/thickness), growth temperature, and strain initiation sequence (gradual or abrupt strain introduction) on...

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Main Authors: Jandl, Adam Christopher, Bulsara, Mayank, Fitzgerald, Eugene A.
Other Authors: Massachusetts Institute of Technology. Department of Materials Science and Engineering
Format: Article
Language:en_US
Published: American Institute of Physics 2014
Online Access:http://hdl.handle.net/1721.1/91951
https://orcid.org/0000-0002-1891-1959
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author Jandl, Adam Christopher
Bulsara, Mayank
Fitzgerald, Eugene A.
author2 Massachusetts Institute of Technology. Department of Materials Science and Engineering
author_facet Massachusetts Institute of Technology. Department of Materials Science and Engineering
Jandl, Adam Christopher
Bulsara, Mayank
Fitzgerald, Eugene A.
author_sort Jandl, Adam Christopher
collection MIT
description The properties of InAs [subscript x]P1[subscript −x] compositionally graded buffers grown by metal organic chemical vapor deposition are investigated. We report the effects of strain gradient (ε/thickness), growth temperature, and strain initiation sequence (gradual or abrupt strain introduction) on threading dislocation density, surface roughness, epi-layer relaxation, and tilt. We find that gradual introduction of strain causes increased dislocation densities (>10[superscript 6]/cm[superscript 2]) and tilt of the epi-layer (>0.1°). A method of abrupt strain initiation is proposed which can result in dislocation densities as low as 1.01 × 10[superscript 5] cm[superscript −2] for films graded from the InP lattice constant to InAs [subscript 0.15]P[subscript 0.85]. A model for a two-energy level dislocation nucleation system is proposed based on our results.
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spelling mit-1721.1/919512022-10-02T03:42:15Z Materials properties and dislocation dynamics in InAsP compositionally graded buffers on InP substrates Jandl, Adam Christopher Bulsara, Mayank Fitzgerald, Eugene A. Massachusetts Institute of Technology. Department of Materials Science and Engineering Jandl, Adam Christopher Bulsara, Mayank Fitzgerald, Eugene A. The properties of InAs [subscript x]P1[subscript −x] compositionally graded buffers grown by metal organic chemical vapor deposition are investigated. We report the effects of strain gradient (ε/thickness), growth temperature, and strain initiation sequence (gradual or abrupt strain introduction) on threading dislocation density, surface roughness, epi-layer relaxation, and tilt. We find that gradual introduction of strain causes increased dislocation densities (>10[superscript 6]/cm[superscript 2]) and tilt of the epi-layer (>0.1°). A method of abrupt strain initiation is proposed which can result in dislocation densities as low as 1.01 × 10[superscript 5] cm[superscript −2] for films graded from the InP lattice constant to InAs [subscript 0.15]P[subscript 0.85]. A model for a two-energy level dislocation nucleation system is proposed based on our results. National Science Foundation (U.S.) (MIT MRSEC Program Award No. DMR-08-19762) United States. Dept. of Energy (Office of Science, Basic Energy Sciences under award No. DE-FG02-09ER46577) United States. Dept. of Energy (Solid State Solar Thermal Energy Conversion Center, an Energy Research Frontier Center, Award No. DE-FG02-09ER46577) 2014-12-01T15:31:24Z 2014-12-01T15:31:24Z 2014-04 2014-02 Article http://purl.org/eprint/type/JournalArticle 0021-8979 1089-7550 http://hdl.handle.net/1721.1/91951 Jandl, Adam, Mayank T. Bulsara, and Eugene A. Fitzgerald. “Materials Properties and Dislocation Dynamics in InAsP Compositionally Graded Buffers on InP Substrates.” Journal of Applied Physics 115, no. 15 (April 21, 2014): 153503. © 2014 AIP Publishing LLC. https://orcid.org/0000-0002-1891-1959 en_US http://dx.doi.org/10.1063/1.4871289 Journal of Applied Physics Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf American Institute of Physics MIT web domain
spellingShingle Jandl, Adam Christopher
Bulsara, Mayank
Fitzgerald, Eugene A.
Materials properties and dislocation dynamics in InAsP compositionally graded buffers on InP substrates
title Materials properties and dislocation dynamics in InAsP compositionally graded buffers on InP substrates
title_full Materials properties and dislocation dynamics in InAsP compositionally graded buffers on InP substrates
title_fullStr Materials properties and dislocation dynamics in InAsP compositionally graded buffers on InP substrates
title_full_unstemmed Materials properties and dislocation dynamics in InAsP compositionally graded buffers on InP substrates
title_short Materials properties and dislocation dynamics in InAsP compositionally graded buffers on InP substrates
title_sort materials properties and dislocation dynamics in inasp compositionally graded buffers on inp substrates
url http://hdl.handle.net/1721.1/91951
https://orcid.org/0000-0002-1891-1959
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