Three-dimensional defect characterization : focused ion beam tomography applied to tin sulfide thin films

Thesis: S.M., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2014.

Bibliographic Details
Main Author:	Youssef, Amanda
Other Authors:	Tonio Buonassisi.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2014
Subjects:	Mechanical Engineering.
Online Access:	http://hdl.handle.net/1721.1/92112

Internet

http://hdl.handle.net/1721.1/92112