Three-dimensional defect characterization : focused ion beam tomography applied to tin sulfide thin films
Thesis: S.M., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2014.
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| Other Authors: | |
| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2014
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| Online Access: | http://hdl.handle.net/1721.1/92112 |
| _version_ | 1826211777568833536 |
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| author | Youssef, Amanda |
| author2 | Tonio Buonassisi. |
| author_facet | Tonio Buonassisi. Youssef, Amanda |
| author_sort | Youssef, Amanda |
| collection | MIT |
| description | Thesis: S.M., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2014. |
| first_indexed | 2024-09-23T15:11:14Z |
| format | Thesis |
| id | mit-1721.1/92112 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T15:11:14Z |
| publishDate | 2014 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/921122019-04-10T17:42:06Z Three-dimensional defect characterization : focused ion beam tomography applied to tin sulfide thin films 3-dimensional defect characterization : focused ion beam tomography applied to tin sulfide thin films 3D defect characterization : focused ion beam tomography applied to tin sulfide thin films Youssef, Amanda Tonio Buonassisi. Massachusetts Institute of Technology. Department of Mechanical Engineering. Massachusetts Institute of Technology. Department of Mechanical Engineering. Mechanical Engineering. Thesis: S.M., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2014. Cataloged from PDF version of thesis. Includes bibliographical references (pages 81-86). Porosity is postulated to be one of the reasons for the low efficiency of tin sulfide-based devices. This work is a preliminary investigation of the effects of two film growth parameters deposition rate and substrate temperature - on porosity. We employ the focused ion beam tomography technique to characterize and quantify porosity in tin sulfide thin films. We then generate 3D reconstructions of pores inside milled volumes from the films and quantify pore volumes. To explain the results, we employ nucleation theory and develop two different models: (a) a thermodynamic model that assumes pores form primarily from an effect known as "self-shadowing," whereby growth-rate anisotropy results in some grains that grow faster than their neighbors, and (b) a kinetic model that assumes a diffusion-driven process of void formation. We show that both models qualitatively support the experimental results, providing insight into process-structure relations that may improve film quality during growth. by Amanda Youssef. S.M. 2014-12-08T18:49:44Z 2014-12-08T18:49:44Z 2014 2014 Thesis http://hdl.handle.net/1721.1/92112 895868016 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 pages application/pdf Massachusetts Institute of Technology |
| spellingShingle | Mechanical Engineering. Youssef, Amanda Three-dimensional defect characterization : focused ion beam tomography applied to tin sulfide thin films |
| title | Three-dimensional defect characterization : focused ion beam tomography applied to tin sulfide thin films |
| title_full | Three-dimensional defect characterization : focused ion beam tomography applied to tin sulfide thin films |
| title_fullStr | Three-dimensional defect characterization : focused ion beam tomography applied to tin sulfide thin films |
| title_full_unstemmed | Three-dimensional defect characterization : focused ion beam tomography applied to tin sulfide thin films |
| title_short | Three-dimensional defect characterization : focused ion beam tomography applied to tin sulfide thin films |
| title_sort | three dimensional defect characterization focused ion beam tomography applied to tin sulfide thin films |
| topic | Mechanical Engineering. |
| url | http://hdl.handle.net/1721.1/92112 |
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