Improved profile fitting and quantification of uncertainty in experimental measurements of impurity transport coefficients using Gaussian process regression

Improved profile fitting and quantification of uncertainty in experimental measurements of impurity transport coefficients using Gaussian process regression

The need to fit smooth temperature and density profiles to discrete observations is ubiquitous in plasma physics, but the prevailing techniques for this have many shortcomings that cast doubt on the statistical validity of the results. This issue is amplified in the context of validation of gyrokine...

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Bibliographic Details
Main Authors: Chilenski, Mark Alan, Greenwald, Martin J., Howard, Nathaniel Thomas, White, Anne E., Rice, John E., Walk, John R., Jr., Marzouk, Youssef M, Walk Jr, John R
Other Authors: Massachusetts Institute of Technology. Department of Aeronautics and Astronautics
Format: Article
Language:en_US
Published: IOP Publishing 2015
Online Access:http://hdl.handle.net/1721.1/96967
https://orcid.org/0000-0001-8319-5971
https://orcid.org/0000-0003-2951-9749
https://orcid.org/0000-0001-8242-3290
https://orcid.org/0000-0002-4438-729X
https://orcid.org/0000-0001-8324-4227
https://orcid.org/0000-0002-3616-8484
https://orcid.org/0000-0002-0026-6939

Internet

http://hdl.handle.net/1721.1/96967
https://orcid.org/0000-0001-8319-5971
https://orcid.org/0000-0003-2951-9749
https://orcid.org/0000-0001-8242-3290
https://orcid.org/0000-0002-4438-729X
https://orcid.org/0000-0001-8324-4227
https://orcid.org/0000-0002-3616-8484
https://orcid.org/0000-0002-0026-6939

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