A new inverse-modeling-based technique for sub-100-nm MOSFET characterization

Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1999.

Bibliographic Details
Main Author: Lee, Zachary Ka Fai, 1967-
Other Authors: Dimitri A. Antoniadis.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2005
Subjects:
Online Access:http://hdl.handle.net/1721.1/9709