Nanoscale quantification of stress and strain in III-V semiconducting nanostructures

Thesis: Ph. D., Massachusetts Institute of Technology, Department of Materials Science and Engineering, 2015.

书目详细资料
主要作者: Jones, Eric James, Ph. D. Massachusetts Institute of Technology
其他作者: Silvija Gradečak.
格式: Thesis
语言:eng
出版: Massachusetts Institute of Technology 2015
主题:
在线阅读:http://hdl.handle.net/1721.1/98578