Nanoscale quantification of stress and strain in III-V semiconducting nanostructures

Thesis: Ph. D., Massachusetts Institute of Technology, Department of Materials Science and Engineering, 2015.

书目详细资料
主要作者:	Jones, Eric James, Ph. D. Massachusetts Institute of Technology
其他作者:	Silvija Gradečak.
格式:	Thesis
语言:	eng
出版:	Massachusetts Institute of Technology 2015
主题:	Materials Science and Engineering.
在线阅读:	http://hdl.handle.net/1721.1/98578

因特网

http://hdl.handle.net/1721.1/98578