Nanoscale quantification of stress and strain in III-V semiconducting nanostructures

Thesis: Ph. D., Massachusetts Institute of Technology, Department of Materials Science and Engineering, 2015.

Bibliographic Details
Main Author:	Jones, Eric James, Ph. D. Massachusetts Institute of Technology
Other Authors:	Silvija Gradečak.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2015
Subjects:	Materials Science and Engineering.
Online Access:	http://hdl.handle.net/1721.1/98578

Internet

http://hdl.handle.net/1721.1/98578