Nanoscale quantification of stress and strain in III-V semiconducting nanostructures

Nanoscale quantification of stress and strain in III-V semiconducting nanostructures

Thesis: Ph. D., Massachusetts Institute of Technology, Department of Materials Science and Engineering, 2015.

Bibliographic Details
Main Author: Jones, Eric James, Ph. D. Massachusetts Institute of Technology
Other Authors: Silvija Gradečak.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2015
Subjects:
Materials Science and Engineering.
Online Access:http://hdl.handle.net/1721.1/98578

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