Slurry abrasive particle agglomeration experimentation and modeling for chemical mechanical planarization (CMP)

Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2015.

Bibliographic Details
Main Author: Johnson, Joy Marie
Other Authors: Duane S. Boning.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2015
Subjects:
Online Access:http://hdl.handle.net/1721.1/99832
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author Johnson, Joy Marie
author2 Duane S. Boning.
author_facet Duane S. Boning.
Johnson, Joy Marie
author_sort Johnson, Joy Marie
collection MIT
description Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2015.
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spelling mit-1721.1/998322019-04-11T12:57:44Z Slurry abrasive particle agglomeration experimentation and modeling for chemical mechanical planarization (CMP) Johnson, Joy Marie Duane S. Boning. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. Electrical Engineering and Computer Science. Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2015. Cataloged from PDF version of thesis. Includes bibliographical references (pages 177-188). A theoretical modeling approach is developed to predict silica-specific instability in chemical-mechanical polishing (CMP) slurries. In CMP, the formation of large agglomerates is of great concern, as these large particles are associated with high defectivity and poor polishing performance. The proposed model describes the complex CMP slurry system as a colloid under high non-linear shear conditions. The model diverges from the classic colloidal models by focusing on the following: reaction limited agglomeration (RLA) bounded by silica-specific modes of transitory bonding, and modified DVLO assumptions to include chemical activation and hydrodynamic agglomerate break-up condition evaluation. In order to build physical intuition and predict key model parameters, fundamental studies and novel metrology of agglomerates is performed. by Joy Marie Johnson. Ph. D. 2015-11-09T19:51:44Z 2015-11-09T19:51:44Z 2015 2015 Thesis http://hdl.handle.net/1721.1/99832 927405078 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 188 pages application/pdf Massachusetts Institute of Technology
spellingShingle Electrical Engineering and Computer Science.
Johnson, Joy Marie
Slurry abrasive particle agglomeration experimentation and modeling for chemical mechanical planarization (CMP)
title Slurry abrasive particle agglomeration experimentation and modeling for chemical mechanical planarization (CMP)
title_full Slurry abrasive particle agglomeration experimentation and modeling for chemical mechanical planarization (CMP)
title_fullStr Slurry abrasive particle agglomeration experimentation and modeling for chemical mechanical planarization (CMP)
title_full_unstemmed Slurry abrasive particle agglomeration experimentation and modeling for chemical mechanical planarization (CMP)
title_short Slurry abrasive particle agglomeration experimentation and modeling for chemical mechanical planarization (CMP)
title_sort slurry abrasive particle agglomeration experimentation and modeling for chemical mechanical planarization cmp
topic Electrical Engineering and Computer Science.
url http://hdl.handle.net/1721.1/99832
work_keys_str_mv AT johnsonjoymarie slurryabrasiveparticleagglomerationexperimentationandmodelingforchemicalmechanicalplanarizationcmp