Carrier confinement and bond softening in photoexcited bismuth films
Femtosecond pump-probe spectroscopy of bismuth thin films has revealed strong dependencies of reflectivity and phonon frequency on film thickness in the range of 25−40 nm. The reflectivity variations are ascribed to distinct electronic structures originating from strongly varying electronic temperat...
| Main Authors: | , , , , |
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| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
American Physical Society
2015
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| Online Access: | http://hdl.handle.net/1721.1/99920 https://orcid.org/0000-0001-7804-5418 https://orcid.org/0000-0002-0812-9832 |