A novel self-selection bipolar RRAM cell with ultra-low operation currents for cross-point application
A self-selection and self-compliance bipolar RRAM cell based on TiN/HfOx/n+-Si structure is proposed for the CMOS compatible and ultra low power cross-point array application. Electrical forming scheme is important to achieved desired resistive switching performance due to the existing of interface...
Main Authors: | , , , , , , , , , |
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Other Authors: | |
Format: | Conference Paper |
Language: | English |
Published: |
2013
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/101274 http://hdl.handle.net/10220/16309 |