Infrared metrology using visible light
Infrared (IR) spectroscopy and imaging are important tools in metrology, including material analysis, sensing and characterization. Although conventional methods of IR metrology are available, they face challenges related to the high cost and low efficiency of IR light sources and photodetectors. Th...
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| Formaat: | Thesis |
| Taal: | English |
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2019
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| Online toegang: | https://hdl.handle.net/10356/103485 http://hdl.handle.net/10220/47387 |