A new approach to a practical subwavelength resolving microscope

A new approach to a practical subwavelength resolving microscope

Superresolution depends on near-field capture and transfer of high spatial frequencies from the scattering object. These evanescent waves are transferred to a near-field image domain using a negative index material. Measuring images with subwavelength scale resolution in the near field by scanning i...

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Bibliographic Details
Main Authors: Fiddy, Michael A., Chuang, Yi-Chen, Dudley, Richard
Other Authors: School of Electrical and Electronic Engineering
Format: Journal Article
Language:English
Published: 2013
Subjects:
DRNTU::Engineering::Electrical and electronic engineering::Electronic systems::Signal processing
Online Access:https://hdl.handle.net/10356/104226
http://hdl.handle.net/10220/16980

Internet

https://hdl.handle.net/10356/104226
http://hdl.handle.net/10220/16980

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