Defect levels in SnS thin films prepared using chemical spray pyrolysis
The origin of various defect levels in the SnS thin films deposited using chemical spray pyrolysis (CSP) technique has been explored in this manuscript, by employing low-temperature photoluminescence (PL) technique. Concentration of Sn in the samples was varied purposefully by ex situ diffusion in o...
| Main Authors: | , , , , |
|---|---|
| Other Authors: | |
| Format: | Journal Article |
| Language: | English |
| Published: |
2013
|
| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/105008 http://hdl.handle.net/10220/17063 |