Single-event-transient resilient memory for DSP in space applications

Single-event-transient resilient memory for DSP in space applications

We present a radiation-hardened-by-design (RHBD) memory design that mitigates Single-Event-Transients (SETs), Single-Event-Upsets (SEUs) and Dual-Event-Upsets (DEUs), hence significantly enhancing the reliability of digital signal processors (DSPs) for space applications. We achieve these attributes...

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Detalhes bibliográficos
Principais autores: Lwin, Ne Kyaw Zwa, Sivaramakrishnan, H., Chong, Kwen-Siong, Lin, Tong, Shu, Wei, Chang, Joseph S.
Outros Autores: School of Electrical and Electronic Engineering
Formato: Conference Paper
Idioma:English
Publicado em: 2019
Assuntos:
Engineering::Electrical and electronic engineering
Computer Architecture
SRAM Cells
Acesso em linha:https://hdl.handle.net/10356/106084
http://hdl.handle.net/10220/49031
https://dx.doi.org/10.1109/ICDSP.2018.8631639

Internet

https://hdl.handle.net/10356/106084
http://hdl.handle.net/10220/49031
https://dx.doi.org/10.1109/ICDSP.2018.8631639

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