Two-wavelength microscopic speckle interferometry using colour CCD camera

Two-wavelength microscopic speckle interferometry using colour CCD camera

Single wavelength microscopic speckle interferometry is widely used for deformation, shape and non-destructive testing (NDT) of engineering structures. However the single wavelength configuration fails to quantify the large deformation due to the overcrowding of fringes and it cannot provide shape o...

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Bibliographic Details
Main Authors: Upputuri, Paul K., Pramanik, Manojit, Kothiyal, Mahendra Prasad, Nandigana, Krishna Mohan
Other Authors: School of Chemical and Biomedical Engineering
Format: Conference Paper
Language:English
Published: 2015
Subjects:
DRNTU::Engineering::Electrical and electronic engineering::Antennas, wave guides, microwaves, radar, radio
Online Access:https://hdl.handle.net/10356/106900
http://hdl.handle.net/10220/25212

Internet

https://hdl.handle.net/10356/106900
http://hdl.handle.net/10220/25212

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