Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis

Reliability optimization requires models giving a direct relation between changeable design parameters and the reliability of a system . According to the conventional reliability prediction methods, optimization possibility for electronic circuits is by decreasing the temperature , load , voltage ,...

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Bibliographic Details
Main Author: Ajith Abraham Padath
Other Authors: Saratchandran, Paramasivan
Format: Thesis
Language:English
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/13349