Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis

Reliability optimization requires models giving a direct relation between changeable design parameters and the reliability of a system . According to the conventional reliability prediction methods, optimization possibility for electronic circuits is by decreasing the temperature , load , voltage ,...

Полное описание

Библиографические подробности
Главный автор: Ajith Abraham Padath
Другие авторы: Saratchandran, Paramasivan
Формат: Диссертация
Язык:English
Опубликовано: 2008
Предметы:
Online-ссылка:http://hdl.handle.net/10356/13349