Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis
Reliability optimization requires models giving a direct relation between changeable design parameters and the reliability of a system . According to the conventional reliability prediction methods, optimization possibility for electronic circuits is by decreasing the temperature , load , voltage ,...
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| Other Authors: | |
| Format: | Thesis |
| Language: | English |
| Published: |
2008
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| Online Access: | http://hdl.handle.net/10356/13349 |
| _version_ | 1826125436790243328 |
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| author | Ajith Abraham Padath |
| author2 | Saratchandran, Paramasivan |
| author_facet | Saratchandran, Paramasivan Ajith Abraham Padath |
| author_sort | Ajith Abraham Padath |
| collection | NTU |
| description | Reliability optimization requires models giving a direct relation between changeable design parameters and the reliability of a system . According to the conventional reliability prediction methods, optimization possibility for electronic circuits is by decreasing the temperature , load , voltage , changing application environment , part quality screening etc. which are hardly applicable and realized in practical situation . |
| first_indexed | 2024-10-01T06:36:17Z |
| format | Thesis |
| id | ntu-10356/13349 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T06:36:17Z |
| publishDate | 2008 |
| record_format | dspace |
| spelling | ntu-10356/133492023-07-04T15:13:14Z Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis Ajith Abraham Padath Saratchandran, Paramasivan School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits Reliability optimization requires models giving a direct relation between changeable design parameters and the reliability of a system . According to the conventional reliability prediction methods, optimization possibility for electronic circuits is by decreasing the temperature , load , voltage , changing application environment , part quality screening etc. which are hardly applicable and realized in practical situation . Master of Science (Computer Control and Automation) 2008-10-20T07:25:59Z 2008-10-20T07:25:59Z 1998 1998 Thesis http://hdl.handle.net/10356/13349 en 144 p. application/pdf |
| spellingShingle | DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits Ajith Abraham Padath Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis |
| title | Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis |
| title_full | Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis |
| title_fullStr | Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis |
| title_full_unstemmed | Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis |
| title_short | Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis |
| title_sort | reliability modeling and optimization of electronic circuits by stressor susceptibility analysis |
| topic | DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits |
| url | http://hdl.handle.net/10356/13349 |
| work_keys_str_mv | AT ajithabrahampadath reliabilitymodelingandoptimizationofelectroniccircuitsbystressorsusceptibilityanalysis |