Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis
Reliability optimization requires models giving a direct relation between changeable design parameters and the reliability of a system . According to the conventional reliability prediction methods, optimization possibility for electronic circuits is by decreasing the temperature , load , voltage ,...
Main Author: | Ajith Abraham Padath |
---|---|
Other Authors: | Saratchandran, Paramasivan |
Format: | Thesis |
Language: | English |
Published: |
2008
|
Subjects: | |
Online Access: | http://hdl.handle.net/10356/13349 |
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