Model updating of microsystems using test data
In modern electronics technology, the rapid advances of microsystems present an imperative requirement in the modeling and the testing of their dynamic characteristics. Due to particular sophistication of microsystems in design and fabrication, finite element (FE) method has limitations to produce a...
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| Format: | Thesis |
| Language: | English |
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2008
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| Online Access: | https://hdl.handle.net/10356/13416 |