Design and improvements for yield optimization of novel CNT transfer technique
The rapid and consistent downscaling of microelectronic devices is fueled by the desire for faster and smaller devices with lower power consumption. However, a major conundrum faced by the industry is the required real estate to achieve proper electromagnetic (EM) shielding to prevent EM interferenc...
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| Format: | Final Year Project (FYP) |
| Language: | English |
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Nanyang Technological University
2020
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| Online Access: | https://hdl.handle.net/10356/138726 |