Atomic structure of grain boundaries for layered molybdenum disulfide (MoS2)
A study on the atomic structure characterization of grain boundary for monolayered molybdenum disulphide (MoS2) by using aberration-corrected scanning transmission electron microscope (STEM) techniques. The MoS2-MoSe2 heterostructure thin film on silicon wafer are firstly grown by chemical vapour de...
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| अन्य लेखक: | |
| स्वरूप: | Final Year Project (FYP) |
| भाषा: | English |
| प्रकाशित: |
Nanyang Technological University
2020
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| विषय: | |
| ऑनलाइन पहुंच: | https://hdl.handle.net/10356/138860 |