Atomic structure of grain boundaries for layered molybdenum disulfide (MoS2)
A study on the atomic structure characterization of grain boundary for monolayered molybdenum disulphide (MoS2) by using aberration-corrected scanning transmission electron microscope (STEM) techniques. The MoS2-MoSe2 heterostructure thin film on silicon wafer are firstly grown by chemical vapour de...
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Final Year Project (FYP) |
| Language: | English |
| Published: |
Nanyang Technological University
2020
|
| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/138860 |