Defects detection using machine learning in condition monitoring

This final year project aims to make use of machine learning technique in condition monitoring for defects detection on the third rail. The machine learning model taken into consideration is the Support Vector Machine. The critical features were extracted from the data collected. This report analyse...

Бүрэн тодорхойлолт

Номзүйн дэлгэрэнгүй
Үндсэн зохиолч: Tan, Jian Jia
Бусад зохиолчид: See Kye Yak
Формат: Final Year Project (FYP)
Хэл сонгох:English
Хэвлэсэн: Nanyang Technological University 2020
Нөхцлүүд:
Онлайн хандалт:https://hdl.handle.net/10356/140159